NIST Purchases SSTR-F from Laser Thermal to Support the CHIPS for America Metrology Program

The National Institute of Standards and Technology (NIST) has acquired the Steady State Thermoreflectance in Fiber (SSTR-F) tool from Laser Thermal. This move aims to enhance NIST's ability to measure thermal conductivity in various materials used in microelectronic components, aiding the CHIPS for America thermal property metrology program.

Laser Thermal's SSTR-F offers non-contact, non-destructive measurements suitable for thin films, interfaces, and bulk materials. This tool will help NIST tackle key metrology challenges identified across industry, academia, and governmental agencies.

The CHIPS Metrology Program focuses on accurate, precise measurements for microelectronics production. It addresses seven grand challenges, including advanced metrology for future manufacturing and enhancing security of microelectronic components.

John Gaskins, CEO of Laser Thermal, highlighted the importance of SSTR-F in providing data and protocols for the semiconductor industry, particularly as the need for efficient thermal management grows in high-power applications like AI and data centers.